Integrated Scientific Resources

About

Developing test & measurement automated binning and sorting systems for electronic parts and wafers. Controlled Probers, Tapers, Handlers, Source-Meters, NW Analyzers, Switches seetc. (using protocols like SCPI, TSP, MODBUS, IVI VISA) with C# and VB (dot NET standard 2.0 through framework 4.72 and 5.0.) Converted legacy systems based on the many flavors of Basic, Testpoint, Asyst and LabVIEW to modern .NET database-centered (e.g., SQL server, SQLite, and SQL CE) systems. Addressed the needs of fortune 100 to small businesses throughout the United States. Provided complete solutions incorporating complex algorithms, optimization, statistical analysis and process control for over 30 years. Reviewed new instruments for leading cos.

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